Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 2: Determination of Oxygen impurities in Nitrogen, Argon, Helium, Neon and Hydrogen using a galvanic cell

Methanol as fuel for on-/offroad application - Determination of impurities via optical emission spectral analysis with inductively coupled plasma (ICP OES)

Proposed limit values for contaminants in biomethane based on health assessment criteria

Protection against pollution of water intended for human consumption in potable water installations and general requirements for devices to prevent pollution by backflow; German version EN 1717:2025

Ethanol as a blending component for petrol - Determination of higher alcohols, methanol and other impurities - Gas chromatographic method; German and English version prEN 15721:2025

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by optical emission spectrometry by direct current arc excitation (DCArc-OES); German version FprEN 15979:2025

Compost and digestate - Determination of the content of macroscopic impurities and stones; German and English version prEN 16202:2025

Fine ceramics (advanced ceramics, advanced technical ceramics) - Methods for chemical analysis of impurities in aluminium oxide powders using inductively coupled plasma-optical emission spectrometry (ISO 3169:2023); German and English version prEN ISO 3169:2025

Preparation of steel substrates before application of paints and related products - Tests for the assessment of surface cleanliness - Part 15: Extraction of soluble contaminants for analysis by acid extraction

Rare earth - Determination of non-rare earth impurities in individual rare earth metals and their oxides - ICP-AES - Part 1: Analysis of Al, Ca, Mg, Fe and Si (ISO 24181-1:2024); German and English version prEN ISO 24181-1:2025