Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 2: Determination of Oxygen impurities in Nitrogen, Argon, Helium, Neon and Hydrogen using a galvanic cell
Edition 2025-07

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N₂, Ar, He, Ne and H₂ by using a galvanic cell
Edition 1991-03

Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C₁-C₃-hydrocarbons in gaseous hydrogen chloride by gaschromatography
Edition 2021-07

Testing of lubricants - Determination of elements content in additives, wear and other contaminations - Part 1: Direct determination by optical emission spectral analysis with inductively coupled plasma (ICP OES)
Edition 2017-02

Testing of lubricants - Determination of elements content of additives, wear and other contaminations - Part 2: Wavelength dispersive X-ray fluorescence spectrometry (XRF)
Edition 2010-01

Coolants for internal combustion engines - Test methods - Part 3: Direct determination of element contents from additives and impurities by optical emission spectral analysis with inductively coupled plasma (ICP OES)
Edition 2024-05

Advanced technical ceramics - Methods of test for ceramic powders - Part 1: Determination of impurities in alumina; German version EN 725-1:2007
Edition 2008-06

Protection against pollution of water intended for human consumption in potable water installations and general requirements for devices to prevent pollution by backflow; German and English version prEN 1717:2023
Edition 2023-07

Protection against pollution of potable water installations and general requirements of devices to prevent pollution by backflow; German version EN 1717:2000; Technical rule of the DVGW
Edition 2011-08