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Draft standard [New]

OVE EN IEC 63378-6
Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points (IEC 47D/991/CDV) (english version)

Edition 2025-07-01
Public enquiry period until 2025-08-01
Original language English
Price from 28.04 €
Table of contents