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Standards [CURRENT]

OEVE/OENORM EN 62047-9
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011) (german version)

Title (German)

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 9: Prüfverfahren zur Festigkeit von Full-Wafer-Bondverbindungen in der Mikrosystemtechnik (MEMS) (IEC 62047-9:2011) (deutsche Fassung)

Edition 2012-05-01
Original language German
Price from 166.83 €
Table of contents