NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices
Abstract
This part of IEC 62951 specifies the test methods for evaluating the spike dependent plasticity of neuromorphic memristor devices. The test methods in this international standard include spike time dependent plasticity (STDP), indirect STDP, spike rate dependent plasticity (SRDP), and their retention properties. This document shall be applicable to neuromorphic memristor devices without any limitations prone to device technology and size.
Begin
2025-07-23
Planned document number
DIN EN IEC 63550-3
Project number
02233312
