NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - semiconductor devices for IOT system - Part 2: test method of semiconductor photon sources incorporating human factors for wearable equipment
Abstract
This part of IEC 63364-2 specifies procedures and definitions for the test method of semiconductor photon sources for wearable equipment. Human factors are incorporated in this test method. This document deals with the photometry and human moisture effects, which are related to humans. The technical definitions, facilities and procedures will be described.
Begin
2025-06-25
Planned document number
DIN IEC 63364-2
Project number
02233213
