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Draft standard

25/30511533 DC
Draft BS EN 63378-6-1 Thermal standardization on semiconductor packages. Part 6-1. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points. Model creation method using a datasheet of semiconductor device

Edition 2025-04-09

Original language English

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Hydrogen Technologies Standards form the basic framework for market ramp-up

Climate change Standards and specifications support climate targets

Smart Farming Standards and specifications are drivers for the digitalization of agriculture

25/30511533 DC Draft BS EN 63378-6-1 Thermal standardization on semiconductor packages. Part 6-1. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points. Model creation method using a datasheet of semiconductor device

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25/30511533 DC
Draft BS EN 63378-6-1 Thermal standardization on semiconductor packages. Part 6-1. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points. Model creation method using a datasheet of semiconductor device