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IEC 47/1906/NP
Proposal of the Korean NC: (Future IEC 62047-8): Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
ISO/ASTM AWI 52972
Additive manufacturing - Qualification principles - Test method for the gas permeability of sand moulds and cores designed with a property control structure
ISO/IEC AWI 9075-16
Information technology - Database languages SQL - Part 16: Property Graph Queries (SQL/PGQ)
NA 159-01-27 AA -dormant
Quality in Intellectual Property Management
IEC/SC 65E/WG 2
Product properties & classification
ISO/TC 86/SC 8/WG 7
Refrigerant properties
ISO/TC 193/SC 1/WG 13
Thermodynamic properties
ISO/TC 6/WG 3
Optical properties
ISO/TC 6/SC 2/WG 30
Tensile properties
ISO/TC 94/SC 13/WG 1
General properties
