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IEC 47E/293/NP
(Future IEC 60747-14-5): Discrete semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
ISO/DIS 8668-2
Aircraft - Terminal junction systems - Part 2: Tests
NA 140-00-14-06 UA -dormant
Terminal junction systems
DIN EN IEC 63378-6
Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points
