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IEC 49/938/NP
Guide to measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
IEC 49/939/CD
IEC 62643-1 Ed.1: ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORSOF ASSESSED QUALITY - Part 1: Generic specification
IEC 49/942/CDV
IEC 62575-2 Ed.1 : Radio Frequency (RF) Bulk Acoustic Wave (BAW) Filters of Assessed Quality - Part 2 :Guide to the use
IEC 49/960/NP
Future IEC 60444-10 Ed.1.0: Measurement of quartz crystal units parameters - Part 10 Test fixture for crsytal devices in GHz band
IEC 49/961/NP
Surface Acoustic Wave (SAW) Controlled Oscillators Using SAW Resonators and SAW Delay Lines - Part 1: Generic specification
IEC 49/962/NP
Future IEC 62604-1 Ed.1.0: Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers - Part 1: Generic specification
IEC 49/984/NP
Future IEC 62575-1 Ed.1 : Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part I Generic specification
IEC 49/993/CD
IEC 62604-1 Ed.1: Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
IEC 49/998/CD
IEC 62575-1 Ed.1: Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
IEC 49/1004/CDV
IEC 60444-6 Ed.2: Measurement of quartz crystal unit parameters - Part 6 : Measurement of drive level dependence (DLD)
