Future IEC 61338-1-5: Waveguide type dielectric resonators, Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

IEC 61837-2 Ed.2: Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

IEC 62604-2,Ed.1: Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers - Part 2 :Guide to the use

IEC 60679-3 Ed.3: Quartz crystal controlled oscillators ofassessed quality - Part 3: Standard outlines and lead connections

IEC/TS 61994-2 Ed.2: PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY CONTROL,SELECTION AND DETECTION - GLOSSARY - Part 2: Piezoelectric and dielectric filters

IEC 62276 Ed.2: Single Crystal Wafers for Surface Acoustic Wave (SAW) devices applications - specicication and measuring method.

IEC/TS 61994-3 Ed.2: PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY CONTROL, SELECTION AND DETECTION- GLOSSARY - Part 3: Piezoelectric and dielectric oscillators

IEC 61837-1 Ed.2: Surface mounted piezoelectric devices for frequency control and selection - Standard outline and terminal lead connections - Part 1: Plastic moulded enclosure outlines

IEC 60862-2 Ed.3: Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guide to the use

IEC 61240 Ed.2: Piezoelectric devices - Preparation of outline drawings of surface-mounted device (SMD) for frequency control and selection - General rules