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IEC 49/785/NP
RF BAW filters - Part 2:Guide to the use
IEC 49/790/NP
IEC 60444-X: Measurement of Quartz Crystal Unit Parameters Standard Method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
IEC 49/803/NP
Proposal of Japanese NC: Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers - Part 2: Guide to the use
IEC 49/807/DC
Consideration of the work of WG 9: Maintenance work
IEC 49/810/DC
Proposal to revise the title and the scope of TC 49
IEC 49/833/NP
Proposal of JPNC: Surface acoustic wave oscillators of assessed quality - Part 1: Generic specification
IEC 49/841/DC
Consideration of the maintenance work of WG1 and WG6: Amendment of IEC 60122-1 Ed.3 Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 49/842/DC
Consideration of the maintenance work of WG1, WG6 and WG 7: Amendment of IEC 60679-1 Ed.3 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 49/847/DC
TC 49 draft Strategic Business Plan (SBP)
IEC 49/850/NP
Proposal of Japanese NC: Electrostatic Micro Electro Mechanical Systems (MEMS) oscillators of assembled quality - Part 1 : Generic specification
