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IEC 49/841/DC
Consideration of the maintenance work of WG1 and WG6: Amendment of IEC 60122-1 Ed.3 Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 49/842/DC
Consideration of the maintenance work of WG1, WG6 and WG 7: Amendment of IEC 60679-1 Ed.3 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 49/847/DC
TC 49 draft Strategic Business Plan (SBP)
IEC 49/850/NP
Proposal of Japanese NC: Electrostatic Micro Electro Mechanical Systems (MEMS) oscillators of assembled quality - Part 1 : Generic specification
IEC 49/874/NP
Future IEC 61338-1-5: Waveguide type dielectric resonators, Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
IEC 49/884/CDV
IEC 61837-2 Ed.2: Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
IEC 49/885/CDV
IEC 62604-2,Ed.1: Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers - Part 2 :Guide to the use
IEC 49/906/CD
IEC 60679-3 Ed.3: Quartz crystal controlled oscillators ofassessed quality - Part 3: Standard outlines and lead connections
IEC 49/922/DTS
IEC/TS 61994-2 Ed.2: PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY CONTROL,SELECTION AND DETECTION - GLOSSARY - Part 2: Piezoelectric and dielectric filters
IEC 49/927/CDV
IEC 62276 Ed.2: Single Crystal Wafers for Surface Acoustic Wave (SAW) devices applications - specicication and measuring method.
