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CSA C22.2 No. 61010-2-061
Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 2-061: Particular requirements for laboratory atomic spectrometers with thermal atomization and ionization (Adopted IEC 61010-2-061:2018, fourth edition, 2018-09, with Canadian deviations)
Edition
2019-08-01
NF B43-411 ; NF ISO 19618:2025-02-26
Fine ceramics (advanced ceramics, advanced technical ceramics) - Measurement method for normal spectral emissivity using blackbody reference with an FTIR spectrometer
Edition
2025-02-26
NF M60-841 ; NF EN ISO 23547:2023-07-19
Measurement of radioactivity - Gamma emitting radionuclides - Reference measurement standard specifications for the calibration of gamma-ray spectrometers
Edition
2023-07-19
20/30368187 DC
BS EN 61010-2-061 AMD1. Safety requirements for electrical equipment for measurement, control and laboratory use. Part 2-061. Particular requirements for laboratory atomic spectrometers with thermal atomization and ionization
Edition
2020-12-04
24/30465180 DC
BS ISO 21501-1 Determination of particle size distribution - Single particle light interaction methods. Part 1: Light scattering aerosol spectrometer
Edition
2024-11-21
25/30500395 DC
BS ISO 13084 Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Edition
2025-03-17
BS ISO 13084
Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
Edition
2018-11-16
BS ISO 14291
Vacuum gauges. Definitions and specifications for quadrupole mass spectrometers
Edition
2012-08-31
BS ISO 15106-6
Plastics. Film and sheeting. Determination of water vapour transmission rate. Atmospheric pressure ionization mass spectrometer method
Edition
2015-04-30
BS ISO 15632
Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
Edition
2021-02-22