Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018
Edition 2018-10

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006 + A1:2012); German version EN 60749-27:2006 + A1:2012
Edition 2013-04

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (IEC 60749-28:2022); German version EN IEC 60749-28:2022
Edition 2024-12

Electrostatics - Part 3-1: Methods for simulation of electrostatic effects - Human body model (HBM) electrostatic discharge test waveforms (IEC 61340-3-1:2006); German version EN 61340-3-1:2007
Edition 2008-03

Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms (IEC 61340-3-2:2006); German version EN 61340-3-2:2007
Edition 2007-11

OPC unified architecture - Part 14: PubSub (IEC 62541-14:2020); English version EN IEC 62541-14:2020
Edition 2021-08

Geographic information - Land Administration Domain Model (LADM) (ISO 19152:2012); English version EN ISO 19152:2012
Edition 2013-03

Geographic information - Land Administration Domain Model (LADM) - Part 1: Generic conceptual model (ISO 19152-1:2024); English version EN ISO 19152-1:2024
Edition 2024-06

Geographic information - Land Administration Domain Model (LADM) - Part 2: Land registration (ISO/DIS 19152-2:2024); English version prEN ISO 19152-2:2024
Edition 2024-05

Geographic information - Land Administration Domain Model (LADM) - Part 3: Marine georegulation (ISO 19152-3:2024); English version EN ISO 19152-3:2024
Edition 2024-10