Soft soldering - Part 5: Registration and analysis of defects on printed board assemblies (IEC 91/182/CDV)
Edition 2000-03-01

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 3-302: Detection of plating defects in unpopulated circuit boards by computed tomography (CT) (IEC 91/1973/CDV) (english version)
Edition 2024-11-01

Timber Structures Part 3: Test Methods for characterization of defect-free specimens for timber of native forests
Edition 2022-06-29

Fabrics - Classification method based on defect scoring inspection
Edition 2025-03-18

Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for GaN crystal surface defects - Part 2: method for determining etch pit density
Edition 2024-05-22

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 3-302 : detection of plating defects in unpopulated circuit boards by computed tomography (CT)

BS ISO 4149 Green coffee - Olfactory and visual examination and determination of foreign matter and defects
Edition 2024-09-24

BS EN IEC 61189-3-302. Test methods for electrical materials, printed board and other interconnection structures and assemblies. Part 3-302. Detection of plating defects in unpopulated circuit boards by computed tomography (CT)
Edition 2024-03-08

BS EN IEC 63068-5 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Part 5. Test method for defects using X-ray topography
Edition 2024-07-12

BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers. Part 1: Classification of defects
Edition 2024-08-16