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UNE-EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
Edition
2011-03-01
SAE AIR 5020A
Time-Dependent In-Flight Thrust Determination
Edition
2012-05-29
BS ISO 22514-2
Statistical methods in process management. Capability and performance. Process capability and performance of time-dependent process models
Edition
2017-02-28
ASTM C 1735
Standard Test Method for Measuring the Time Dependent Modulus of Sealants Using Stress Relaxation
Edition
2017
ASTM C 1735
Standard Test Method for Measuring the Time Dependent Modulus of Sealants Using Stress Relaxation
Edition
2017
24/30495490 DC
BS ISO 22514-2 Statistical methods in process management - Capability and performance. Part 2: Process capability and performance of time-dependent process models
Edition
2024-10-09
BS 7346-5
Components for smoke and heat control systems. Functional recommendations and calculation methods for smoke and heat exhaust ventilation systems, employing time-dependent design fires. Code of practice
Edition
2005-03-31
ASTM D 7406
Standard Test Method for Time-Dependent Compressive Deformation Under Constant Pressure for Geosynthetic Drainage Products
Edition
2020
ASTM D 7406
Standard Test Method for Time-Dependent Compressive Deformation Under Constant Pressure for Geosynthetic Drainage Products
Edition
2020
EIA JESD 92
Procedure for Characterizing Time- Dependent Dielectric Breakdown of Ultra-Thin Gate Dielectrics
Edition
2003-08
