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Standards [CURRENT]

DIN EN ISO 19749

Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
Edition 2023-07

Technical rule [CURRENT]

DIN SPEC 52407

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
Edition 2015-03

Technical Specification

DIN CEN/TS 18117

Workplace exposure - Detection and characterization of airborne NOAA using electron microscopy - Rules for sampling and analysis; English version CEN/TS 18117:2025
Edition 2025-04

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