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DIN EN 55015 Beiblatt 1 ; VDE 0875-15-1 Beiblatt 1:2014-12
Limits and methods of measurement of radio disturbance characteristics of electrical lighting and similar equipment; Supplement 1: Test method on electromagnetic emissions - Part 1: Electronic control gear for single- and double-capped fluorescent lamps (CISPR/TR 30-1:2012)
Edition
2014-12
DIN EN 55015 Beiblatt 2 ; VDE 0875-15-1 Beiblatt 2:2014-12
Limits and methods of measurement of radio disturbance characteristics of electrical lighting and similar equipment; Supplement 2: Test method on electromagnetic emissions - Part 2: Electronic control gear for discharge lamps excluding fluorescent lamps (CISPR/TR 30-2:2012)
Edition
2014-12
DIN EN IEC 61967-1 ; VDE 0847-21-1:2019-09
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 61967-1:2018); German version EN IEC 61967-1:2019
Edition
2019-09
DIN EN 61967-2
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005); German version EN 61967-2:2005
Edition
2006-03
DIN EN IEC 61967-4 ; VDE 0847-21-4:2023-08
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method (IEC 61967-4:2021); German version EN IEC 61967-4:2021
Edition
2023-08
DIN EN 61967-5
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday Cage method (IEC 61967-5:2003); German version EN 61967-5:2003
Edition
2003-10
DIN EN 61967-6
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008
Edition
2008-10
DIN EN 61967-6 Berichtigung 1
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:2008-10; (IEC-Cor. :2010 to IEC 61967-6:2002)
Edition
2011-02
DIN EN IEC 61967-8 ; VDE 0847-21-8:2024-10
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2023); German version EN IEC 61967-8:2023
Edition
2024-10
DIN EN 62433-2 ; VDE 0847-33-2:2017-10
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2017); German version EN 62433-2:2017
Edition
2017-10
