Semiconductor devices - Metallization stress void test (IEC 62418:2010); German version EN 62418:2010
Edition 2010-12

Control technology - Rules for the designation of measuring instruments (IEC 62419:2008); German version EN 62419:2009
Edition 2009-06

Concentric lay stranded overhead electrical conductors containing one or more gap(s) (IEC 62420:2008); German version EN 62420:2008
Edition 2009-03

Electronics assembly technology - Electronic modules (IEC 62421:2007); German version EN 62421:2007
Edition 2008-06

Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses (IEC 62423:2009, modified + corrigendum Dec. 2011); German version EN 62423:2012 + A11:2021 + A12:2022
Edition 2023-12

Representation of process control engineering - Requests in P&I diagrams and data exchange between P&ID tools and PCE-CAE tools (IEC 62424:2016); German version EN 62424:2016
Edition 2017-12

Electric power enginering - Modal components in three-phase a.c. systems - Quantities and transformations (IEC 62428:2008); German version EN 62428:2008
Edition 2009-02

Reliability growth - Stress testing for early failures in unique complex systems (IEC 62429:2007); German version EN 62429:2008
Edition 2008-08

Environmentally conscious design (ECD) - Principles, requirements and guidance (IEC 62430:2019); German version EN IEC 62430:2019
Edition 2022-10

Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods (IEC 62431:2008); German version EN 62431:2008
Edition 2009-07