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NA 062

DIN Standards Committee Materials Testing

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Standards [New]

ISO 17297
Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary

Title (German)

Mikrobereichsanalyse – TEM-Probenvorbereitung mittels fokussierter Ionenstrahlen - Fachwörterverzeichnis

Responsible national committee

NA 062-08-18 AA - Electron microscopy and microbeam analysis  

Responsible international committee

ISO/TC 202/SC 1 - Terminology  

Edition 2025-05
Original language English
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Table of contents

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