DIN Standards Committee Information Technology and IT Applications
Characterization methods for ion traps used in quantum computing and sensing
Abstract
This document specifies the experimental setup, measurement procedure, and analysis of measured data to evaluate the main parameters of interest of ion traps. Furthermore, minimal requirements for the reporting of the experimental setup for the evaluation of main parameters of interest are specified. Therefore, this document is separated into two main sections: i. Trap specifications ii. Measured properties The two main sections include several sub sections giving detailed description of the tested trap (section i.) e.g., for fabrication used materials, geometry and the key performance indicators (section ii.) e.g., heating rate, trap potential. Furthermore, an appendix with a brief description of the principles of the used methods and detailed description of the used setup will be added. The appendix will also include guidance how the measuremen ts can be compared to similar measurements best.
Begin
2025-06-11
WI
JT022012
Planned document number
prEN XXX-JT022012
Responsible national committee
NA 043-02-05 AA - Quantum Technologies
