NA 022
DKE German Commission for Electrical, Electronic & Information Technologies of DIN and VDE
Project
Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices
Abstract
This part of IEC 6XXXX specifies the test methods for evaluating the basic characteristics of neuromorphic memristor devices. The test methods in this international standard include initialize, read, forming, potentiation and depression. This document is applicable to 2-terminal neuromorphic memristor devices without any limitations prone to device technology and size.
Begin
2025-06-27
Planned document number
DIN EN IEC 63550-1
Project number
02233217
